Mem-May 3, 2007
From STDFGroup
STDF Memory Datalog meeting Notes
Date*: 3rd May 2007
Attendees:
Kochen Liao -- Qualcomm
Liang Lai -- Mentor Graphics
Sauro Landini -- ARM
Ajay Khoche -- Verigy
Ping Wen -- Yield Dynamics
Sergey Shekyan -- Virage Logic
Myk Herndon -- PDF Solutions
John Chen -- PDF Solutions
Agenda:
- Review of requirement document
Minutes:
Presentation by PDF on the memory Bit map requirements
- The group reviewed the the requirement document from PDF solutions
- Following observations were made
- Data obtained from the ATE could be pre/post scrambling; memory tester can typically do unscrambling
- Images obtained from ATE are huge (GBs); Run length encoding is used to compress the images.
- No Standard format for row/col bitmap. Support formats 15 differnt formats including, HPL, Advantest, KLA pixel map,
- PDF solutions would rather prefer to not to deal with these many formats.
- Currently tester provide either raw bitmap (50% cases) or tester log (other 50%)
- would like to have a place in the standard to indicate which flow was used
- it is always difficult to overlay the bitmap over a defect.
- Currently a different file is used for each instance of a memory in a chip so a chip 600 embedded memories would lead to 600 different file where the file names are used to identify the instance.
- Currently tool needs following condition information: Voltage, Test Pattern, temperature, speed of the test
- Wafermap configuration information allows normalization of the different coordinate systems being used.
- Die dimension is stored to ovelay bitmap with the physical view.
- PDF suggested format is in ASCII due to readability requirements for debugging
Action Items:
- PDF to check if they can share the presentation for adding to the Web (Myk & John)
- Prepare starting requirements document (Ajay)
- Review ST' proposal (All)
